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1

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2008 IEEE International Conference on Microelectronic Test Structures：ICMTS : conference proceedings : March 24-27, The University of Edinburgh, UK

Corporate Authors: IEEE International Conference on Microelectronic Test Structures (21st 2008 University of Edinburgh, UK; IEEE Electron Devices Society; IEEE Xplore Online service
Published: IEEE,
Publication Dates: c2008.
Call Number: TN407-532/I61/2008

Book

2

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Device Research Conference：60th DRC, June 24-26, 2002, University of California, Santa Barbara, Calif.

Corporate Authors: Device Research Conference (60th 2002 University of California; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers
Published: Institute of Electrical and Electronics Engineering,
Publication Dates: c2002.
Call Number: TN103-532/D492/2002

Book

3

Cover is for reference only

Conference record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002：Hyatt Regency, New Orleans, Louisiana, May 19-24, 2002

Corporate Authors: IEEE Photovoltaic Specialists Conference (29th 2002 New Orleans, La; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers
Published: IEEE,
Publication Dates: c2002.
Call Number: TM914-532/I59/2002

Book

4

Cover is for reference only

58th DRC：Device Research Conference : conference digest : June 19-21, 2000, University of Denver, Denver, Colorado

Corporate Authors: Device Research Conference (58th 2000 University of Denver, Denver, Colo; IEEE Electron Devices Society
Published: IEEE,
Publication Dates: [2000].
Call Number: TN103-532/D492/2000

Book

5

Cover is for reference only

2000 5th International Workshop on Statistical Metrology：IWSM : June 11, 2000/Hawaii

Corporate Authors: International Workshop on Statistical Metrology (5th 2000 Honolulu, Hawaii; IEEE Electron Devices Society
Published: IEEE,
Publication Dates: c2000.
Call Number: TB9-532/I61/2000

Book

6

Cover is for reference only

2008 33rd IEEE Photovoltaic Specialists Conference (Pvsc), San Diego, California, USA, 11-16 May 2008

Corporate Authors: IEEE Photovoltaic Specialists Conference (33rd 2008 San Diego, California, USA; Institute of Electrical and Electronics Engineers
Published: IEEE,
Publication Dates: 2009.
Call Number: TM914-532/I59/2008

Book

7

Cover is for reference only

Conference record of the Thirty-First IEEE Photovoltaic Specialists Conference, 2005：Coronado Springs Resort, Lake Buena Vista, FL, January 3-7, 2005

Corporate Authors: IEEE Photovoltaic Specialists Conference (31st 2005 Lake Buena Vista, Fla; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers
Published: IEEE,
Publication Dates: c2005.
Call Number: TM914-532/I59/2005

Book

8

Cover is for reference only

Conference record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference--2000：Anchorage Hilton Hotel, Anchorage, AK, 15-22 September, 2000

Corporate Authors: IEEE Photovoltaic Specialists Conference (28th 2000 Anchorage, Alaska; Institute of Electrical and Electronics Engineers; IEEE Electron Devices Society
Published: IEEE,
Publication Dates: c2000.
Call Number: TM914-532/I59/2000

Book

9

Cover is for reference only

Conference record of the Twenty Sixth IEEE Photovoltaic Specialists Conference, 1997：Anaheim Marriott, Anaheim, CA, 29 September - 03 October 1997

Corporate Authors: IEEE Photovoltaic Specialists Conference (26th 1997 Anaheim, Calif; Institute of Electrical and Electronics Engineers; IEEE Electron Devices Society
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c1997.
Call Number: TM914-532/I59/1997/

Book

10

Cover is for reference only

Conference Record of the Twenty fifth IEEE Photovoltaic Specialists Conference, 1996：Hyatt Regency Crystal City, Washington, D.C., May 13-17, 1996

Corporate Authors: IEEE Photovoltaic Specialists Conference (25th 1996 Washington, D.C; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c1996.
Call Number: TM914-532/I59/1996/

Book

11

Cover is for reference only

Proceedings of the IEEE 1990 Custom Integrated Circuits Conference, Boston, Mass., May 13-16, 1990

Corporate Authors: IEEE Custom Integrated Circuits Conference (1990 Boston, Mass
Published: IEEE,
Publication Dates: c1990.
Call Number: TN4-53/C987/1990/

Book

12

Cover is for reference only

Proceedings of the IEEE 1988 Custom Integrated Circuits Conference, May 16-19, 1988, Rochester, New York

Corporate Authors: IEEE Custom Integrated Circuits Conference (10th 1988 Rochester, NY; IEEE Electron Devices Society
Published: IEEE,
Publication Dates: 1988.
Call Number: TN4-53/C987/1988/

Book

13

Cover is for reference only

Proceedings of the IEEE 1985 Custom Integrated Circuits Conference, The Portland Hilton, Portland, Oregon, May 20-23, 1985

Corporate Authors: Custom Integrated Circuits Conference (1985 Portland, Oregon; IEEE Electron Devices Society
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c1985.
Call Number: TN4-53/C987/1985/

Book

14

Cover is for reference only

2006 IEEE International Integrated Reliability Workshop final report：Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005

Corporate Authors: International Integrated Reliability Workshop (2006 S. Lake Tahoe, Calif; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Electron Devices Society IEEE Reliability Society,
Publication Dates: c2006.
Call Number: TN406-532/I61/2006

Book

15

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2005 IEEE International Integrated Reliability Workshop final report：Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005

Corporate Authors: International Integrated Reliability Workshop (2005 S. Lake Tahoe, Calif; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Electron Devices Society IEEE Reliability Society,
Publication Dates: c2005.
Call Number: TN406-532/I61/2005

Book

16

Cover is for reference only

1998 IEEE International Integrated Reliability Workshop final report：Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998

Corporate Authors: International Integrated Reliability Workshop (1998 Lake Tahoe, California; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Electron Devices Society,
Publication Dates: c1998.
Call Number: TN406-532/I61/1998/

Book

17

Cover is for reference only

Reliability physics 1988：26th annual proceedings, Monterey, Ca., April 12-14, 1988

Published: IEEE,
Publication Dates: c1988.
Call Number: TN306-53/I59.1/1988/

Book

18

Cover is for reference only

Reliability physics 1986, 24th annual proceedings, Anaheim, California, April 1-3, 1986

Corporate Authors: Institute of Electrical and Electronics Engineers. Annual (24th 1986 Anaheim, California
Group Author: IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE,
Publication Dates: c1986.
Call Number: TN306-53/I59.1/1986/

Book

19

Cover is for reference only

Reliability physics 1985：23rd annual proceedings, Orlando, Fl., March 26-28, 1985

Corporate Authors: International Reliability Physics Symposium. Annual (23rd 1985 Orlando, Fl; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE,
Publication Dates: c1985.
Call Number: TN306-53/I59.1/1985/

Book

20

Cover is for reference only

Reliability physics 1984：22nd annual proceedings, Las Vegas, Nevada., April 3-5, 1984

Corporate Authors: International Reliability Physics Symposium. Annual (22nd 1984 Las Vegas, Nevada; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE,
Publication Dates: c1984.
Call Number: TN306-53/I59.1/1984/

Book

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