1
Proceedings : thirty-third annual meeting, Electron Microscopy Society of America, Las Vegas, Nevada, August 11-15, 1975 /

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America
Group Author: Bailey, G.W; Arceneaux, Claude J
Published: Claitor's Pub. Division,
Publication Dates: [1975]
Call Number: TN153-532/E38-1/1975
Book
Save to List
Saved in:
2
Proceedings 29th Annual Meeting, Electron Microscopy Society of America, Boston, Mass., Aug. 9-13, 1971

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America
Group Author: Arceneaux Claude J
Published: Claitor,
Publication Dates: 1971.
Call Number: T715.510.41/CE38
Book
Save to List
Saved in:
3
Proceedings 28th annual meeting, Electron Microscopy Society of America, Houston, Texas, Oct. 5-8, 1970

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America
Group Author: Arceneaux Claude J
Published: Claitor,
Publication Dates: 1970.
Call Number: T715.510.41/CE38
Book
Save to List
Saved in:
4
Proceedings 27th Annual Meeting, Electron Microscopy Society of America, St. Paul, Minnesota. August 26-29, 1969

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America
Group Author: Arceneaux Claude J
Published: Calitor's Pub. Division,
Publication Dates: 1969.
Call Number: T715.510.41/CE38
Book
Save to List
Saved in:
5
Twenty-sixth annual meeting Electron Microscopy Society of America New Orleans, Louisiana, September 16-19, 1968

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America
Group Author: Arceneaux Claude J
Published: Claitor's Pub. Division,
Publication Dates: 1968.
Call Number: TN153-53/E38-1/1968
Book
Save to List
Saved in:
6
Proceedings 35th Annual Meeting Electron Microscopy Society of America, Boston, Aug. 22-26, 1977

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America (1977)
Group Author: Arceneaux Claude J
Published: Claitor's Pub. Division,
Publication Dates: 1977.
Call Number: TN153-53/E38-1/1977/
Book
Save to List
Saved in:
7
Proceedings 33th Annual Meeting, Las Vegas, Nevada, Aug. 11-15, 1975.

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America (1975)
Group Author: Arceneaux Claude J
Published: Claitor's Pub. Division,
Publication Dates: 1975.
Call Number: TN153-53/E38-1/1975/
Book
Save to List
Saved in:
8
Proceedings 32d Annual Meeting Electron Microscopy SOciety of America, Aug. 13-15, 1974, St. Louis, Mo.

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America (1974)
Group Author: Arceneaux Claude J
Published: Claitor's Pub. Division,
Publication Dates: 1974.
Call Number: TN153-53/E38-1/1974/
Book
Save to List
Saved in:
9
Proceedings 31st Annual Meeting, New Orleans, Louisiana, Aug. 14-17, 1973

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America (1973)
Group Author: Arceneaux Claude J
Published: Claitor's Pub. Division,
Publication Dates: 1973.
Call Number: TN153-53/E38-1/1973/
Book
Save to List
Saved in:
10
Introduction to analytical electron microscopy

Cover is for reference only
Corporate Authors: Electron Microscopy Society of America; Microbeam Analysis Society
Group Author: Hren John J; Goldstein Joseph 1939-; Joy David C 1943-
Published: Plenum Press,
Publication Dates: c1979.
Call Number: TN153/H873/
Book
Save to List
Saved in:
11
Physical aspects of electron microscopy and microbeam analysis

Cover is for reference only
Main Authors: Siegel Benjamin M (edited by Benjamin M. Siegel and D. R. Beaman.)
Corporate Authors: Electron Microscopy Society of America; Microbeam Analysis Society
Group Author: Beaman Donald Robert (joint author.)
Published: Wiley,
Publication Dates: [1975]
Call Number: TN153-53/E38/1973/
Book
Save to List
Saved in:
Search Tools: Get RSS Feed — Email this Search —