Summary of a workshop on the technology, policy and cultural dimensions of biometric systems

Corporate Authors: National Research Council U.S.. Whither Biometrics Committee; National Research Council U.S.. Division on Engineering and Physical Sciences; National Research Council U.S.. Computer Science and Telecommunications Board; National Academies Press U.S; Workshop on Technical, Policy, and Cultural Dimensions of Biometric Systems (2005 Washington, D.C.)
Group Author: Batch Kristen; Millett Lynette I; Pato Joseph N
Published: National Academies Press,
Publication Dates: c2006.
Call Number: Q-332/S955