Passivity of metals and semiconductors : proceedings of the Fifth International Symposium on Passivity Bombannes, France, May 30-June 3, 1983 /
Passivity of Metals and Semiconductors covers the proceedings of the Fifth International Symposium on Passivity, held in Bombannes, France on May30 - June3, 1983. The said symposium is concerned with passivity of metallic materials, localized corrosion, experimental techniques, and classical techniq...
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Corporate Authors: | ; ; |
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Group Author: | |
Published: |
Elsevier,
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Publisher Address: | Amsterdam ; New York : |
Publication Dates: | 1983. |
Literature type: | eBook |
Language: | English |
Series: |
Thin films science and technology ; 4. |
Subjects: | |
Online Access: |
http://www.sciencedirect.com/science/book/9780444422521 |
Summary: |
Passivity of Metals and Semiconductors covers the proceedings of the Fifth International Symposium on Passivity, held in Bombannes, France on May30 - June3, 1983. The said symposium is concerned with passivity of metallic materials, localized corrosion, experimental techniques, and classical techniques such as optical techniques and electron spectroscopy. The book is divided into five sections. Section I deals with the concepts involved in the composition-transport phenomena and covers topics such as the transport of oxygen and water in oxide layers; the kinetics of oxidation of silicon; and t. |
Item Description: | Dissolution and passivation. |
Carrier Form: | 1 online resource : illustrations. |
Bibliography: | Includes bibliographical references and index. |
ISBN: |
9781483102627 1483102629 |
Index Number: | QD501 |
CLC: | TG17-53 |
Contents: |
Front Cover; Passivity of Metals and Semiconductors; Copyright Page; Dedication; ACKNOWLEDGMENTS; SPONSORSHIPS; SCIENTIFIC COMMITTEE; FOREWORD; Tabble of Contents; SECTION I: CONCEPTS -- COMPOSITION- TRANSPORT PHENOMENA; CHAPTER 1. TRANSPORT OF OXYGEN AND WATER IN OXIDE LAYERS; ABSTRACT; ACKNOWLEDGEMENTS; REFERENCES; CHAPTER 2. AN OVERVIEW OF THE KINETICS OF OXIDATION OF SILICON: THE VERY THIN SIO2 FILM GROWTH REGIME; INTRODUCTION; THE LITERATURE; SUMMARY; References; CHAPTER 3. TRANSFER REACTIONS ON OXIDES AND PASSIVE LAYERS; ABSTRACT; INTRODUCTION; PRINCIPLES OF ET-THEORY; THIN FILMS. THICK FILMSET VIA SURFACE STATES; CONCLUSION; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 4. ELECTRONIC PROPERTIES OF MODIFIED PASSIVE FILMS; ABSTRACT; INTRODUCTION; PREPARATION; REPASSIVATION; CAPACITY; ELECTRON TRANSFER REACTIONS (ETR); DISCUSSION; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 5. ON THE OXIDATION RATE LAWS OF METALS THAT FORM NONSTOICHIOMETRIC OXIDES; ABSTRACT; I. INTRODUCTION; II. THEORY; III. DISCUSSION; Acknowledgement; REFERENCES; CHAPTER 6. AN IMPEDANCE APPROACH OF THE PASSIVE FILM ON IRON IN ACIDIC MEDIA; INTRODUCTION; EXPERIMENTAL; RESULTS AND DISCUSSION. EFFECTS OF IONS ON THE PASSIVE STATELOW FREQUENCY DOMAIN; CONCLUSION; REFERENCES; CHAPTER 7. ELECTROCHEMICAL KINETICS OF IRON AND IRON HYDROXIDE IN AQUEOUS ELECTROLYTES; ABSTRACT; INTRODUCTION; RESULTS AND DISCUSSION; CONCLUSIONS; REFERENCES; CHAPTER 8. IRON PASSIVATION IN BORATE SOLUTIONS; ABSTRACT; INTRODUCTION; METHODS; RESULTS; DISCUSSION; REFERENCES; CHAPTER 9. THE ROLE OF INHIBITOR PAB AT NiOOH-LAYERS; ABSTRACT; INTRODUCTION; EXPERIMENTAL; RESULTS; DISCUSSION; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 10. OPTICAL AND IMPEDANCE STUDIES OF NICKEL PASSIVATION FILM IN NEUTRAL SOLUTION; ABSTRACT. INTRODUCTIONEXPERIMENTAL; RESULT; DISCUSSION; REFERENCES; CHAPTER 11. ELECTROREFLECTANCE FOR THE STUDY OF THE PASSIVITY OF IRON; ABSTRACT; EXPERIMENTAL; RESULTS; CONCLUSION; REFERENCES; CHAPTER 12. ELECTROCHEMICAL AND ELLIPSOMETRIC INVESTIGATION OF PASSIVE FILMS FORMED ON IRON IN BORATE SOLUTION; ABSTRACT; INTRODUCTION; EXPERIMENTAL PROCEDURE; RESULTS and DISCUSSION; REFERENCES; CHAPTER 13. AN ELLIPSOMETRIC STUDY OF THE PASSIVITY OF IRON IN NEUTRAL BORATE ELECTROLYTE; ABSTRACT; INTRODUCTION; RESULTS AND DISCUSSION; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 14. RAMAN STUDIES OF PASSIVE FILMS ON IRON. ABSTRACTEXPERIMENTAL; RESULTS; DISCUSSION; REFERENCES; CHAPTER 15. RAMAN SPECTROSCOPY OF OXIDE LAYERS ON PURE IRON IN ELECTROCHEMICAL ENVIRONMENT; ABSTRACT; INTRODUCTION; EXPERIMENT; DISCUSSION; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 16. APPLICATION OF ANGLE RESOLVED XPS AND AES DEPTH PROFILING TO THE STUDY OF TRANSPASSIVE FILMS ON NICKEL; ABSTRACT; INTRODUCTION; EXPERIMENTAL; RESULTS; DISCUSSION AND CONCLUSIONS; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 17. PASSIVATION OF NICKEL -- IRON ALLOYS. INFLUENCE OF SULPHUR; ABSTRACT; INTRODUCTION; INITIAL SURFACE COMPOSITION OF THE Ni/Fe ALLOYS. |