Screen Library工程纳米测量基础 = Fundamental principles of engineering nanometrology
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| Main Authors: | |
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| Group Author: | ; ; ; |
| Published: |
浙江大学出版社
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| Publisher Address: | 杭州 |
| Publication Dates: | 2017 |
| Literature type: | Book |
| Language: | Chinese |
| Edition: | 2版 |
| Subjects: | |
| Carrier Form: | 300页: 图 ; 24cm |
| ISBN: | 978-7-308-17563-0 |
| Index Number: | TB22 |
| CLC: | TB22 |
| Call Number: | TB22/2946 |
| Contents: |
有书目 本书共分十章，内容包括：微纳米和先进制造中的测量技术、测量基础知识、精密测量仪器设计原则、干涉法长度溯源、位移测量、表面形貌测量仪器等。 |