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Automated optical inspection for industry：6-7 November 1996, Beijing, China

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Bibliographic Details
Corporate Authors: Chung-kuo kuang hsüeh hsüeh hui.; Kuo chia tzu jan k`o hsüeh chi chin wei yüan hui (China); Society of Photo-Optical Instrumentation Engineers
Group Author: Yeh Sheng-hua, 1934-; Wu Frederick Y.
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1996.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 2899
Subjects:
Quality control > Congresses. > Congresses. > Congresses.
Optical detectors > Congresses. > Congresses.
Optical measurements > Congresses.
Engineering inspection > Congresses. > Congresses.
Carrier Form: xi, 716 p.: ill. ; 28 cm.
ISBN: 0819423009
Index Number: TP277
CLC: TP277-532
Call Number: TP277-532/A939/1996/
Contents: Includes bibliographical references and index.

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