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Ninth International Symposium on Laser Metrology：30 June-2 July 2008, Singapore

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Bibliographic Details
Corporate Authors: International Symposium on Laser Metrology (9th 2008 Singapore; National University of Singapore. Dept. of Mechanical Engineering; Singapore. Agency for Science, Technology and Research; Singapore Institue of Manufacturing Technology; SPIE Society; Nanyang Technological University. School of Mechanical and Aerospace Engineering
Group Author: Asundi Anand; Quan Chenggen
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c2008.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 7155
Subjects:
Optical measurements > Industrial applications
Lasers > Industrial applications
Laser interferometers
Measurement
Carrier Form: 2 v.: ill. ; 28 cm.
ISBN: 9780819473981
0819473987
Index Number: TN249
CLC: TN249-532
TN247-532
Call Number: TN247-532/I617/2008
Contents: Includes bibliographical references and author index.

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