Optics and Photonics for Advanced Dimensional Metrology : 6-10 April 2020, Online Only, France /

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Bibliographic Details
Corporate Authors: Optics and Photonics for Advanced Dimensional Metrology Online Only, France; SPIE Society
Group Author: Groot, Peter J. de; Leach, Richard; Picart, Pascal
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2020]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 11352
Subjects:
Item Description: "At SPIE Photonics Europe" -- Cover.
Carrier Form: 1 volume (various pagings) : illustrations, forms ; 28 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510634763 (paperback) :
CLC: TB96-532
Call Number: TB96-532/O627-2/2020