Screen LibraryDimensional optical metrology and inspection for practical applications VII : 17-19 April 2018, Orlando, Florida, United States /
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| Corporate Authors: | |
|---|---|
| Group Author: | ; |
| Published: |
SPIE,
|
| Publisher Address: | Bellingham, Washington : |
| Publication Dates: | [2018] |
| Literature type: | Book |
| Language: | English |
| Series: |
Proceedings of SPIE,
volume 10667 |
| Subjects: | |
| Item Description: | "SPIE defense + commercial sensing" -- Cover. |
| Carrier Form: | 1 volume (various pagings) : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographical references. |
| ISBN: | 9781510618459 (paperback) : |
| CLC: | TB96-532 |
| Call Number: | TB96-532/D582/2018 |