Screen LibraryIntroduction to focused ion beam nanometrology /
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| Main Authors: | |
|---|---|
| Corporate Authors: | ; |
| Published: |
Morgan & Claypool Publishers,
|
| Publisher Address: |
San Rafael, CA : Bristol, UK : |
| Publication Dates: |
[2015] [2015] |
| Literature type: | Book |
| Language: | English |
| Series: |
IOP concise physics,
|
| Subjects: | |
| Item Description: |
"Version: 20151001"--Title page verso. "A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso. |
| Carrier Form: | 1 volume (various pagings) : illustrations (some color) ; 24 cm. |
| Bibliography: | Includes bibliographical references. |
| ISBN: | 9781681740201 |
| Index Number: | QC176 |
| CLC: | TB383 |
| Call Number: | TB383/C877 |