Semiconductor process and device performance modeling:symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A.

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Bibliographic Details
Group Author: (Scott T.); Nelson Jeffrey S.; (Jeffrey Steven); Dunham S. T.
Published: Materials Research Society,
Publisher Address: Warrendale, Pa.
Publication Dates: c1998.
Literature type: Book
Language: English
Series: Materials Research Society symposium proceedings, ; v. 490
Subjects:
Carrier Form: ix, 273 p.: ill. ; 24 cm.
ISBN: 1558993959
Index Number: TN304
CLC: TN304.205-532
TN305-532
TN304.105-532
Call Number: TN304.105-532/S471/1997/
Contents: Includes bibliographical references and indexes.