Screen LibraryTransmission electron microscopy of semiconductor nanostructures：an analysis of composition and strain state
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| Main Authors: | |
|---|---|
| Published: |
Springer,
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| Publisher Address: | Berlin New York |
| Publication Dates: | c2003. |
| Literature type: | Book |
| Language: | English |
| Series: |
Springer tracts in modern physics ; 182 |
| Subjects: | |
| Carrier Form: | xii, 238 p.: ill. (some col.) ; 24 cm. |
| Publication Frequency: | Also available via the World Wide Web. |
| ISBN: | 3540004149 (alk. paper) |
| Index Number: | TN303 |
| CLC: |
TN303 TN16 |
| Call Number: | TN303/R813 |
| Contents: | Includes bibliographical references and index. |