Transmission electron microscopy of semiconductor nanostructures:an analysis of composition and strain state
Saved in:
Main Authors: | |
---|---|
Published: |
Springer,
|
Publisher Address: | Berlin New York |
Publication Dates: | c2003. |
Literature type: | Book |
Language: | English |
Series: |
Springer tracts in modern physics ; 182 |
Subjects: | |
Carrier Form: | xii, 238 p.: ill. (some col.) ; 24 cm. |
Publication Frequency: | Also available via the World Wide Web. |
ISBN: | 3540004149 (alk. paper) |
Index Number: | TN303 |
CLC: |
TN303 TN16 |
Call Number: | TN303/R813 |
Contents: | Includes bibliographical references and index. |