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Electromagnetic Non-destructive Evaluation (XXIII) /

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Bibliographic Details
Corporate Authors: International Workshop on Electromagnetic Nondestructive Evaluation Chengdu, China)
Group Author: Tian, Guiyun; Gao, Bin, 1974-
Published: IOS Press,
Publisher Address: Amsterdam, Netherlands :
Publication Dates: [2020]
Literature type: Book
Language: English
Series: Studies in Applied Electromagnetics and Mechanics, volume 45
Subjects:
Magnetic testing > Congresses.
Electromagnetic measurements > Congresses.
Nondestructive testing > Congresses.
Electromagnetic measurements.
Magnetic testing.
Nondestructive testing.
Carrier Form: xvi, 296 pages : illustrations ; 24 cm.
Bibliography: Includes bibliographical references and indexes.
ISBN: 9781643681184
1643681184
Index Number: TA417
CLC: TM623.7-532
Call Number: TM623.7-532/E38/2019

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