Next-generation analyst VI : 16-17 April 2018, Orlando, Florida, United States /

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Bibliographic Details
Corporate Authors: Next-Generation Analyst Conference Orlando, Florida, United States; SPIE Society
Group Author: Hanratty, Timothy P; Llinas, James
Published: SPIE,
Publisher Address: Bellingham, Washington, USA :
Publication Dates: [2018]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 10653
Subjects:
Item Description: "SPIE. Defense + commercial sensing"--Cover.
Carrier Form: 1 volume (various pagings) : illustrations, forms ; 28 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510618176 (paperback) :
1510618171 (paperback)
CLC: TP393.092-532
Call Number: TP393.092-532/N567/2018