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EUV and X-ray optics : synergy between laboratory and space V : 26-27 April 2017, Prague, Czech Republic /

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Bibliographic Details
Corporate Authors: SPIE Society; Science and Technology Facilities Council United Kingdom
Group Author: Hudec, R; Pina, Ladislav
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2017]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 10235
Subjects:
Far ultraviolet radiation > Congresses
X-ray optics > Congresses
X-ray astronomy > Congresses
Space optics > Congresses
Ultraviolet astronomy > Congresses
Item Description: "SPIE optics + optoelectronics" -- Cover.
Previous conference proceedings published as part of SPIE volume 8777, titled: Damage to VUV, EUV, and X-ray optics IV.
Carrier Form: 1 volume (various pagings) : illustrations ; 28 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510609716 (paperback) :
CLC: P172-532
O434-532
Call Number: O434-532/E969/2017

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