System dependability and analytics : approaching system dependability from data, system and analytics perspectives /

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Bibliographic Details
Group Author: Wang, Long; Pattabiraman, Karthik; Di Martino, Catello; Athreya, Arjun; Bagchi, Saurabh; Iyer, Ravishankar K.
Published: Springer,
Publisher Address: Cham, Switzerland :
Publication Dates: [2023]
Literature type: Book
Language: English
Series: Springer series in reliability engineering,
Subjects:
Item Description: Festschrift for Ravishankar K. Iyer.
Carrier Form: xi, 433 pages : illustrations, forms ; 24 cm.
Bibliography: Includes bibliographical references.
ISBN: 9783031020629
3031020626
CLC: TB114.3-32
Call Number: TB114.3-32/S995