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Sixth International Symposium on Precision Engineering Measurements and Instrumentation：8-11 August 2010, Hangzhou, China

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Bibliographic Details
Corporate Authors: International Symposium on Precision Engineering Measurements and Instrumentation (6th 2010 Hangzhou, China); International Committee on Measurements and Instrumentation.; SPIE (Society); Ha'erbin gong ye da xue.; Zhongguo ji liang ce shi xue hui. Instrumentation Committee.; Zhongguo ji liang da xue.; Hefei gong ye da xue.
Group Author: (Jiubin); Wen Xianfang.; Tan J.
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c2010.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 7544
Subjects:
Physical measurements
Measurement.
Laser interferometers.
Optical measurements
Carrier Form: 3 v. (various pagings): ill. ; 28 cm.
ISBN: 0819479403
9780819479402
Index Number: O432
CLC: O432.2-532
Call Number: O432.2-532/I617/2010
Contents: Includes bibliographical references and author index.

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