Automated variable temperature Hall effect measurements and analysis of n-type gallium arsenide, indium phosphide and their lattice matched alloy semiconductors

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Bibliographic Details
Main Authors: Lepkowski Thomas Richard 1949-
Published: s.n.],
Publisher Address: [S.l.
Publication Dates: 1985.
Literature type: Book
Language: English
Carrier Form: xvi, 345 leaves, bound: ill. ; 29 cm.
Index Number: O472
CLC: O472
Call Number: O472/L596/
Contents: Typescript.
Vita.
Available on microfilm from University Microfilms.
Bibliography: leaves 326-344.