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Image quality, an overview：April 9-10, 1985, Arlington, Virginia

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Bibliographic Details
Corporate Authors: Sira Limited.; SPIE Conference on Image Quality: an Overview (1985 Arlington, Va.) (Arlington, Va.)); Society of Photo-Optical Instrumentation Engineers
Group Author: Granger Edward M.; Baker L. R.; (Lionel R.)
Published: SPIE--the International Society for Optical Engineering,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1985.
Literature type: Book
Language: English
Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 549
Subjects:
Imaging systems > Congresses. > Congresses.
Carrier Form: vi, 166 p.: ill. ; 28 cm.
ISBN: 0892525843 (pbk.)
Index Number: TN27
CLC: TN27-532
Call Number: TN27-53/I31.4/1985/
Contents: Papers presented at the SPIE Conference on Image Quality: an Overview.
Includes bibliographies and index.

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