Machine vision applications in industrial inspection XIII:17-18 January 2005, San Jose, California, USA
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Corporate Authors: | ; |
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Group Author: | ; |
Published: |
SPIE IS&T,
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Publisher Address: | Bellingham, Wash. Springfield, Va. |
Publication Dates: | c2005. |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of electronic imaging science and technology ; vol. 5679 |
Subjects: | |
Carrier Form: | viii, 302 p.: ill. ; 28 cm. |
ISBN: | 0819456527 |
Index Number: | TB4 |
CLC: | TB4-532 |
Call Number: | TB4-532/M149/2005 |
Contents: | Includes bibliographical references and author index. |