Screen LibraryX-ray diffraction at elevated temperatures：a method for in situ process analysis
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| Group Author: | |
|---|---|
| Published: |
VCH,
|
| Publisher Address: | New York |
| Publication Dates: | c1993. |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Carrier Form: | viii, 268 p.: ill. ; 24 cm. |
| ISBN: | 0895737450 |
| Index Number: | O434 |
| CLC: | O434.14 |
| Call Number: | O434.14/X8/ |
| Contents: | Includes bibliographical references and index. |