Screen Library半导体材料与器件表征技术 = Semiconductor material and device characterization
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| Main Authors: | |
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| Corporate Authors: | |
| Published: |
大连理工大学出版社
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| Publisher Address: | 大连 |
| Publication Dates: | 2008 |
| Literature type: | Book |
| Language: | Chinese |
| Subjects: | |
| Carrier Form: | 20,542页: 图 ; 24cm |
| ISBN: | 978-7-5611-4138-0 |
| Index Number: | TN304 |
| CLC: |
TN304 TN303 |
| Call Number: | TN304/0262 |
| Contents: | 本书共10章，包括：电阻率，载流子和掺杂浓度，接触电阻、肖特基势垒及电迁移，串联电阻、沟道长度与宽度、阈值电压及热载流子等内容。 |