半导体材料与器件表征技术 = Semiconductor material and device characterization
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Main Authors: | |
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Corporate Authors: | |
Published: |
大连理工大学出版社
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Publisher Address: | 大连 |
Publication Dates: | 2008 |
Literature type: | Book |
Language: | Chinese |
Subjects: | |
Carrier Form: | 20,542页: 图 ; 24cm |
ISBN: | 978-7-5611-4138-0 |
Index Number: | TN304 |
CLC: |
TN304 TN303 |
Call Number: | TN304/0262 |
Contents: | 本书共10章,包括:电阻率,载流子和掺杂浓度,接触电阻、肖特基势垒及电迁移,串联电阻、沟道长度与宽度、阈值电压及热载流子等内容。 |