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1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

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Bibliographic Details
Corporate Authors: International Workshop on Statistical Metrology (2nd 1997 Kyoto, Japan; IEEE Electron Devices Society
Published: Institute of Electrical and Electronics Engineers,
Publisher Address: [New York]
Publication Dates: c1997.
Literature type: Book
Language: English
Subjects:
Semiconductors > Characterization > Statistical methods > Congresses
Semiconductors > Measurement > Congresses
Carrier Form: vi, 124 p.: ill. ; 28 cm.
ISBN: 0780337379 (softbound)
0780337387 (microfiche)
Index Number: TN470
CLC: TN470.7-532
TB9-532
Call Number: TN470.7-532/I61/1997/
Contents: "IEEE cat. no. 97TH8246."
Includes bibliographical references.

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