X-ray calibration:techniques, sources, and detectors
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Corporate Authors: | |
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Group Author: | ; |
Published: |
SPIE--the International Society for Optical Engineering,
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Publisher Address: | Bellingham, Wash., USA |
Publication Dates: | c1986. |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE--the International Society for Optical Engineering ; v. 689 |
Subjects: | |
Carrier Form: | vi, 254 p.: ill. ; 28 cm. |
ISBN: | 0892527242 (pbk.) |
Index Number: | O431 |
CLC: | O431.1-532 |
Call Number: | O431.1-53/X1/1986/ |
Contents: |
"[Meeting held] 19-20 August 1986, San Diego, California." Includes bibliographies and index. |