Reset Filters
Author: 《青少年科普图书馆文库》编委会编
Literature type: Book
Language: Chinese
Circulation Type: Children's loan materials AND General loan materials AND In-Library Use Only

Cover is for reference only

Stress-induced phenomena in metallization：8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12-14 September 2005

Saved in:
Bibliographic Details
Corporate Authors: International Workshop on Stress-Induced Phenomena in Metallization (8th 2005 Dresden, Germany)
Group Author: Zschech Ehrenfried.
Published: American Institute of Physics,
Publisher Address: Melville, N.Y.
Publication Dates: 2006.
Literature type: Book
Language: English
Series: AIP conference proceedings ; v. 817
Subjects:
Metal-metal bonds.
Strength of materials.
Nanostructured materials.
Semiconductors
Copper > Electric properties
Semicondutores (congressos)
Interconnects (Integrated circuit technology) > Defects
Carrier Form: xi, 372 p.: ill. (some col.) ; 24 cm.
Publication Frequency: Also available online.
ISBN: 0735403104
9780735403109
Index Number: TG172
CLC: TG172.9-532
Call Number: TG172.9-532/S915/2005
Contents: Subseries from web page.
Includes bibliographical references and indexes.

Related Book Recommendations