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2008 IEEE International Conference on Microelectronic Test Structures：ICMTS : conference proceedings : March 24-27, The University of Edinburgh, UK

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Bibliographic Details
Corporate Authors: IEEE International Conference on Microelectronic Test Structures (21st 2008 University of Edinburgh, UK; IEEE Electron Devices Society; IEEE Xplore Online service
Published: IEEE,
Publisher Address: Piscataway, NJ
Publication Dates: c2008.
Literature type: Book
Language: English
Subjects:
Electronic apparatus and appliances > Testing
Integrated circuits > Testing
Semiconductors > Testing
Carrier Form: xi, 242 p.: ill. (some col.) ; 28 cm.
ISBN: 9781424418008 (pbk.)
Index Number: TN407
CLC: TN407-532
Call Number: TN407-532/I61/2008
Contents: Title from copyright page.
"IEEE catalog number: CFP08MTS-PRT".
"... International Conference on Microelectronic Test Structures (ICMTS 2008) ... is the 21st anniversary of the ICMTS"--P. ii.
Access restricted to subscribers.
Includes bibliographical references and index.

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