Characterization methods for submicron MOSFETs

Saved in:
Bibliographic Details
Group Author: Haddara Hisham
Published: Kluwer Academic Publishers,
Publisher Address: Boston
Publication Dates: c1995.
Literature type: Book
Language: English
Series: The Kluwer international series in engineering and computer science ; SECS 352.
Subjects:
Carrier Form: vii, 232 p.: ill. ; 24 cm.
ISBN: 0792396952 (acid-free paper)
Index Number: TN386
CLC: TN386.1
Call Number: TN386.1/C469/
Contents: Includes bibliographical references and index.