Instruments for optics and optoelectronic inspection and control:8-10 November 2000, Beijing, China
Saved in:
Corporate Authors: | ; ; |
---|---|
Group Author: | ; ; |
Published: |
SPIE,
|
Publisher Address: | Bellingham, Wash., USA |
Publication Dates: | c2000. |
Literature type: | Book |
Language: | English |
Series: |
SPIE proceedings series ; v. 4223 |
Subjects: | |
Carrier Form: | xx, 268 p.: ill. ; 28 cm. |
ISBN: | 0819438944 |
Index Number: | TH74 |
CLC: |
TH74-532 TN2-532 TN25-532 |
Call Number: | TN2-532/I599/2000 |
Contents: | Includes bibliographical references and index. |