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Machine vision systems for inspection and metrology VII：4-5 November, 1998, Boston, Massachusetts

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Bibliographic Details
Corporate Authors: Machine Vision Association of SME; Society of Photo-Optical Instrumentation Engineers
Group Author: Miller John W. V; Solomon Susan Snell; Batchelor Bruce G
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1998.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 3521
Subjects:
Engineering inspection > Automation > Congresses
Optical measurements > Congresses
Computer vision > Industrial applications > Congresses
Computer vision > Congresses
Carrier Form: xi, 386 p.: ill. ; 28 cm.
ISBN: 0819429821
Index Number: TP274
CLC: TP274-532
TP391.4-532
Call Number: TP391.4-532/M149/1998/
Contents: Includes bibliographical references and index.

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