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Vector Network Analyzer (VNA) Measurements and Uncertainty Assessment /

This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes...

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Bibliographic Details
Main Authors: Shoaib, Nosherwan (Author)
Corporate Authors: SpringerLink (Online service)
Published: Springer International Publishing : Imprint: Springer,
Publisher Address: Cham :
Publication Dates: 2017.
Literature type: eBook
Language: English
Series: PoliTO Springer Series,
Subjects:
Engineering.
Physical measurements.
Measurement.
Microwaves.
Optical engineering.
Electronic circuits.
Microwaves, RF and Optical Engineering.
Measurement Science and Instrumentation.
Circuits and Systems.
Online Access: http://dx.doi.org/10.1007/978-3-319-44772-8
Summary: This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes a fully analytical approach to measurement uncertainty evaluation, while also highlighting the interaction and the linear propagation of different uncertainty sources to compute the final uncertainties associated with the measurements. The book subsequently discusses the dimensional characterization of waveguide standards and the quality of the vector network analyzer (VNA) calibration techniques. The book concludes with an in-depth description of the novel verification artefacts used to assess the performance of the VNAs. It offers a comprehensive reference guide for beginners to experts, in both academia and industry, whose work involves the field of network analysis, instrumentation and measurements.
Carrier Form: 1 online resource(xiv,82pages): illustrations.
ISBN: 9783319447728
Index Number: TK7876
CLC: O45
Contents: General Introduction -- Waveguide Measurement Uncertainty -- VNA Calibration Comparison -- VNA Connection Repeatability Investigation -- VNA Verication Artefacts -- Conclusions.

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