Terrestrial neutron-induced soft errors in advanced memory devices

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Bibliographic Details
Group Author: Nakamura Takashi 1939-
Published: World Scientific,
Publisher Address: Hackensack, NJ
Publication Dates: c2008.
Literature type: Book
Language: English
Subjects:
Carrier Form: xxii, 343 p.: ill. (some col.) ; 24 cm.
ISBN: 9789812778819
9812778810
Index Number: TP333
CLC: TP333.5
Call Number: TP333.5/T325
Contents: Includes bibliographical references (p. 291-315) and index.