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2001 6th International Workshop on Statistical Methodology

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Bibliographic Details
Corporate Authors: International Workshop on Statistical Methodology (6th 2001 Kyoto, Japan; IEEE Electron Devices Society
Published: IEEE,
Publisher Address: Piscataway, NJ
Publication Dates: c2001.
Literature type: Book
Language: English
Subjects:
Semiconductors > Measurement
Integrated circuits > Very large scale integration > Defects
Integrated circuits > Very large scale integration > Design and construction > Statistical methods
Semiconductors > Characterization > Statistical methods
Carrier Form: vi, 67 p.: ill. ; 28 cm.
Publication Frequency: Also available via the World Wide Web with additional title: Statistical Methodology, IEEE International Workshop on, 2001 6th.
ISBN: 0780366883 (softbound)
Index Number: TB9
CLC: TB9-532
Call Number: TB9-532/I61/2001
Contents: "IEEE Cat. No. 01TH8550"
"June 10, 2001/Kyoto"
Includes bibliographical references.

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