International Symposium on Optical Fabrication, Testing, and Surface Evaluation:10-12 June 1992, Tokyo, Japan
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Corporate Authors: | ; |
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Group Author: | |
Published: |
SPIE,
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Publisher Address: | Bellingham, Wash. |
Publication Dates: | c1992. |
Literature type: | Book |
Language: | English |
Series: |
SPIE proceedings series ; v. 1720 |
Subjects: | |
Carrier Form: | xiii, 632 p.: ill. ; 28 cm. |
ISBN: | 0819408875 |
Index Number: | TH74 |
CLC: | TH74-532 |
Call Number: | TH74-532/I61/1992/ |
Contents: | Includes bibliographical references and index.. |