Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France /

Based on The International Metrology Congress meeting, this reference examines the evolution of metrology, and its applications in industry, environment and safety, health and medicine, economy and quality, and new information and communication technologies; details the?improvement of measurement pr...

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Bibliographic Details
Corporate Authors: International Metrology Conference French College of Metrology); Collège français de métrologie.; Wiley InterScience (Online service)
Published:
Literature type: Electronic eBook
Language: English
Subjects:
Online Access: http://onlinelibrary.wiley.com/book/10.1002/9780470611371
Summary: Based on The International Metrology Congress meeting, this reference examines the evolution of metrology, and its applications in industry, environment and safety, health and medicine, economy and quality, and new information and communication technologies; details the?improvement of measurement procedures to guarantee the quality of products and processes; and discusses the?development of metrology linked to innovating technologies. The themes of the Congress (quality and reliability of measurement, measurement uncertainties, calibration, verification, accreditation, sensory metrology, regul.
Carrier Form: 1 online resource (xi, 813 pages) : illustrations
Bibliography: Includes bibliographical references and index.
ISBN: 9780470611371
0470611375
9780470393987 (electronic bk.)
047039398X (electronic bk.)
Index Number: T50
CLC: TB9-532
Contents: Transverse Disciplines in Metrology; Table of Contents; Preface; Chemistry -- Statistics/Gas Analysis; Hydraulic Quantities; Recent Development of the ITS; The SI, Now and Tomorrow; Health and Safety; Metrological Tools and Means; Environment; Dimensional Metrology and Uncertainty; Innovation and Knowledge Transfer; Uncertainty; Sensory Metrology; Electricity; Legal Metrology; Monte Carlo; Mass; Optic -- Time Frequency; Statistics; Overview; Index of Authors.