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Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing：August 7-8, 2000, San Jose, California

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Memory Technology, Design and Testing (8th 2000 San Jose, Calif.); IEEE Computer Society; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Group Author: Rajsuman Rochit.; Wik T.; (Thomas)
Published: IEEE Computer Society,
Publisher Address: Los Alamitos, Calif.
Publication Dates: c2000.
Literature type: Book
Language: English
Subjects:
Semiconductor storage devices > Testing.
Random access memory.
Carrier Form: x, 131 p.: ill. ; 28 cm.
ISBN: 0769506895
0769506909 (case)
0769506917 (microfiche)
Index Number: TP333
CLC: TP333.5-532
Call Number: TP333.5-532/I59.1/2000
Contents: "IEEE Computer Society Order Number PR00689"--T.p. verso.
"This is the 8th year of this exciting event"--p. viii.
Includes bibliographical references and author index.

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