Modeling aspects in optical metrology IV : 13-14 May 2013, Munich, Germany /

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Bibliographic Details
Corporate Authors: SPIE Society; Modeling aspects in optical metrology Munich, Germany
Group Author: Bodermann, Bernd; Frenner, Karsten; Silver, Richard M
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2013]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 8789
Subjects:
Carrier Form: 1 volume (various pagings) : illustrations ; 28 cm.
Bibliography: Includes bibliographical references and index.
ISBN: 9780819496058 :
0819496057
Index Number: QC367
CLC: TN4-532
O432.2-532
Call Number: O432.2-532/M689/2013