X-ray and EUV/FUV spectroscopy and polarimetry:11-12 July, 1995, San Diego, California

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Fineschi Silvano
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1995.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 2517
Subjects:
Carrier Form: vii, 284 p.: ill. ; 28 cm.
ISBN: 0819418765
Index Number: P172
CLC: P172.2-532
Call Number: P172.2-53/X8/1995
Contents: Includes bibliographical references and author index.