Reset Filters
Branch: 延吉分馆[闭馆]

Cover is for reference only

Quantum metrology, imaging, and communication /

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by referen...

Full description

Saved in:
Bibliographic Details
Main Authors: Simon, David S
Group Author: Jaeger, Gregg; Sergienko, Alexander V
Published: Springer,
Publisher Address: Cham, Switzerland :
Publication Dates: [2017]
Literature type: Book
Language: English
Series: Quantum science and technology,
Subjects:
Quantum theory
Quantum computing
Summary: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Carrier Form: xii, 273 pages : illustrations (some color), forms ; 24 cm.
Bibliography: Includes bibliographical references and index.
ISBN: 9783319465494 (hardback) :
331946549X (hardback)
9783319465517 (eBook)
3319465511 (eBook)
Index Number: QC174
CLC: TP385
O413
Call Number: O413/S594
Contents: Quantum Optics and Entanglement -- Two-Photon Interference- Aberration and Dispersion Cancelation -- Quantum Metrology -- Polarization Mode Dispersion -- Ghost Imaging and Related Topics -- Quantum Microscopy -- Correlated and Entangled Orbital Angular Momentum -- Quantum Communication and Cryptography -- Appendices A: Review of Optics -- B: Optical Fields in Quantum Mechanics -- C: Optical Effects of Aberration and Turbulence -- D: Phase Matching in Spontaneous Parametric Down Conversion -- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.

Related Book Recommendations