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Design, analysis and test of logic circuits under uncertainty /

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Bibliographic Details
Main Authors: Krishnaswamy, Smita
Corporate Authors: SpringerLink (Online service)
Group Author: Markov, Igor L. (Igor Leonidovich), 1973-; Hayes, John P. (John Patrick), 1944-
Published: Springer,
Publisher Address: Dordrecht ; New York :
Publication Dates: 2013.
Literature type: eBook
Language: English
Series: Lecture notes in electrical engineering, v.115
Subjects:
Logic circuits > Design.
Logic circuits > Testing.
Uncertainty (Information theory)
COMPUTERS / Logic Design
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic
TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI
Engineering.
Computer hardware.
Computer science.
Logic design.
Operating systems (Computers).
Systems engineering.
Circuits and Systems.
Performance and Reliability.
Symbolic and Algebraic Manipulation.
Electronic books.
Online Access: http://dx.doi.org/10.1007/978-90-481-9644-9
Carrier Form: 1 online resource.
Bibliography: Includes bibliographical references and index.
ISBN: 9789048196449 (electronic bk.)
9048196442 (electronic bk.)
Index Number: TK7868
CLC: TP331.1
Contents: Probabilistic transfer matrices --
Computing with probabilistic transfer matrices --
Testing logic circuits for probabilistic faults --
Signature-Based reliability analysis --
Design for robustness --
Summary and extensions.

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