2009 International Conference on Optical Instruments and Technology:optoelectronic measurement technology and systems : 19-22 October 2009, Shanghai, China
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Corporate Authors: | ; ; ; ; |
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Group Author: | ; ; |
Published: |
SPIE,
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Publisher Address: | Bellingham, Wash. |
Publication Dates: | c2009. |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE ; v. 7511 |
Subjects: | |
Carrier Form: | 1 v. (various pagings): ill. ; 28 cm. |
ISBN: |
9780819478979 0819478970 |
Index Number: | TN20 |
CLC: |
TN20-532 TH74-532 |
Call Number: | TH74-532/I614/2009 |
Contents: | Includes bibliographical references and index. |