2005 International Conference on Simulation of Semiconductor Processes and Devices:SISPAD 2005 : September 1-3, 2005, Komba Eminence, Tokyo, Japan

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Bibliographic Details
Corporate Authors: International Conference on Simulation of Semiconductor Processes and Devices (2005 Tokyo, Japan; ?Oy?o Butsuri Gakkai; IEEE Electron Devices Society; Institute of Electronics, Information and Communication Engineers, IEEE EDS Japan Chapter, IEEE EDS Kansai Chapter
Published: IEEE,
Publisher Address: Piscataway, N.J.
Publication Dates: c2005.
Literature type: Book
Language: English
Subjects:
Carrier Form: xv, 340 p.: ill. ; 28 cm.
ISBN: 4990276205
Index Number: TN305
CLC: TN305-532
Call Number: TN305-532/I61/2005
Contents: "IEEE Catalog Number 05TH8826"--T.p. verso.
Includes bibliographical references and author index.