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Fakebusters II：scientific detection of fakery in art and philately

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers; International Center for Art Intelligence.; Fakes, Forgeries, and Experts (Organization)
Group Author: Weiss Richard J.; (Richard Jerome), 1923-; Chartier Duane R.
Published: World Scientific,
Publisher Address: Singapore Hackensack, N.J.
Publication Dates: c2004.
Literature type: Book
Language: English
Series: Series in popular science ; vol. 4
Subjects:
Art > Forgeries
Art > Radiography.
Art > Expertising.
Expertising, X-ray
Science and the arts
Art and science.
Carrier Form: x, 317 p., [64] p. of plates: ill. (some col.) ; 23 cm.
ISBN: 9812560254 (pbk.)
Index Number: J114
CLC: J114-532
G894-532
K854.2-532
Call Number: K854.2-532/F176/1999
Contents: "Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
Includes bibliographical references.

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