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2005 IEEE International Workshop on Memory Technology, Design and Testing：MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Memory Technology, Design, and Testing (13th 2005 Taipei, Taiwan; Guo li qing hua da xue Hsin-chu shih, Taiwan; IEEE Computer Society. Technical Council on Test Technology
Published: IEEE Computer Society,
Publisher Address: Los Alamitos, Calif.
Publication Dates: 2005.
Literature type: Book
Language: English
Subjects:
Random access memory
Semiconductor storage devices > Testing
Carrier Form: xxv, 153 p.: ill. ; 27 cm.
Publication Frequency: Also issued online with additional title: Memory Technology, Design, and Testing, 2005, MTDT 2005, 2005 IEEE International Workshop on.
ISBN: 0769523137
Index Number: TP333
CLC: TP333.5-532
Call Number: TP333.5-532/I59.1/2005
Contents: "IEEE Computer Society Order Number P2313"--T.p. verso.
Includes bibliographical references and author index.

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