Reset Filters
Branch: 青浦徐泾镇

Cover is for reference only

Testing, packaging, reliability, and applications of semiconductor lasers IV：28 January 1999, San Jose, California

Saved in:
Bibliographic Details
Corporate Authors: United States. Defense Advanced Research Projects Agency.; Society of Photo-Optical Instrumentation Engineers
Group Author: Linden Kurt J.; Wang S. C.; (Shing Chung), 1934-; Fallahi Mahmoud.
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1999.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 3626
Subjects:
Semiconductor lasers > Reliability.
Diodes, Semiconductor
Semiconductor lasers > Testing
Carrier Form: viii, 262 p.: ill. (some col.) ; 28 cm.
ISBN: 081943096X
Index Number: TN365
CLC: TN365-532
TN248.4-532
Call Number: TN365-532/T344/1999/
TA1700
Contents: Includes bibliographical references and index.

Related Book Recommendations