Cover is for reference only

Polarimetry and ellipsometry：20-23 May, 1996, Kazimierz Dolny, Poland

Saved in:
Bibliographic Details
Corporate Authors: Institute of Applied Optics Poland; Komitet Bada鈔 Naukowych Poland; Society of Photo-Optical Instrumentation Engineers; Society of Photo-optical Instrumentation Engineers. Poland Chapter
Group Author: Wolinski Tomasz R; Szyjer Mariusz; Pluta Maksymilian
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1997.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 3094
Subjects:
Ellipsometry > Congresses
Polarimetry > Congresses
Carrier Form: xvii, 374 p.: ill. ; 28 cm.
ISBN: 0819425095
Index Number: TH744
CLC: TH744.2-532
Call Number: TH744.2-532/P726/1996/
Contents: Includes bibliographic references and indexes.

Related Book Recommendations