Machine vision applications in industrial inspection X:21-22 January, 2002, San Jose, [California] USA
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Corporate Authors: | ; |
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Group Author: | ; |
Published: |
SPIE,
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Publisher Address: | Bellingham, Washington |
Publication Dates: | c2002. |
Literature type: | Book |
Language: | English |
Series: |
SPIE proceedings series ; v. 4664 |
Subjects: | |
Carrier Form: | v, 208 p.: ill. ; 28 cm. |
ISBN: | 0819444049 |
Index Number: | TP274 |
CLC: |
TP274-532 TB4-532 |
Call Number: | TB4-532/M149/2002 |
Contents: | Includes bibliographic references and author index. |