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1999 IEEE International Integrated Reliability Workshop final report：Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

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Bibliographic Details
Corporate Authors: International Integrated Reliability Workshop (1999 Lake Tahoe, Calif; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Electron Devices Society,
Publisher Address: Piscataway, N.J.
Publication Dates: c1999.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Reliability
Integrated circuits > Wafer-scale integration > Reliability
Carrier Form: viii, 188 p.: ill. ; 28 cm.
ISBN: 0780356497 (softbound ed.)
Index Number: TN406
CLC: TN406-532
Call Number: TN406-532/I59/1999/
Contents: "IEEE Catalog No. 99TH8460"--T.p. verso.
Includes bibliographical references.

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