Related Book Recommendations

• Semiconductor measurement technology : spreading resistance analysis for silicon layers with nonuniform resistivity /
  by: Dickey, David H
  Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,
• Preparation and certification of SRM's for calibration of spreading resistance probes /
  by: Ehrstein, James R
  Published: U.S. Dept. of Commerce, National Bureau of Standards ; For sale by the Supt. of Docs., U.S. G.P.O.,
• Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 /
  Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off.,
• Spreading resistance analysis for silicon layers with nonuniform resistivity : David H. Dickey and James R. Ehrstein.
  by: Dickey, David H
  Published:
• An automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices /
  by: Blackburn, David L
  Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off.,