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Author: Marquardt,Michael J

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Automatic inspection and novel instrumentation：25-26 June 1977, Singapore

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Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers. Singapore Chapter; Institute of Physics, Singapore; Society of Photo-optical Instrumentation Engineers. Japan Chapter; Nanyang Technological University; Society of Photo-Optical Instrumentation Engineers
Group Author: Rao Sreenivas; Lee Ming Cheng; Ho Anthony Tung-Shuen
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1997.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 3185
Subjects:
Imaging systems > Industrial applications > Congresses
Quality control > Optical methods > Congresses
Optical detectors > Industrial applications > Congresses
Carrier Form: vii, 170 p.: ill. ; 28 cm.
ISBN: 0819426121
Index Number: TP391
CLC: TP391.4-532
TP216-532
TP274-532
Call Number: TP274-532/A939/1997/
Contents: Includes bibliographical references and index.

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